Measuring Transient Phenomena in Photoexcited BiVO4 by FTIRItamar Benisti , Department of Chemical Engineering, Technion, Haifa, Israel Here we present a third method for studying the excitation of photoactive and, in particular, photocatalytic materials. The method is based on measuring time resolved (5*10-9 sec in resolution) IR spectroscopy of the photocatalytic materials upon excitation with the third harmonic (355 nm) of a Nd:YAG pulsed laser. The time resolved FTIR spectra is obtained by using a “step-scan” configuration, i.e. by recording a temporal signal at a specific location of the moving mirror in the Michelson interferometer, following by altering the position of the mirror and re-measuring the temporal signal upon re-excitation. At the end of the process, an array of data points in the time-distance is obtained, facilitating to perform Fourier Transformation of all data points gathered at a specific time. The technique is demonstrated by measuring temporal changes in the FTIR spectrum of bismuth vanadate, a stable semiconductor having a bandgap of 2.4 eV, which facilitates visible light activity. This photocatalyst has two phases, monoclinic and tetragonal which differ in their activity and is also known to show faceting-related activity, connected with selective accumulation of charge. Clear differences in the relaxation time of the 740 cm-1, representing the V-O between various species were observed, demonstrating the potential of this technique. |
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