New Plasma Observation Approaches and Their Use for High-End Applications

Peter Ivanov, Spectro Analytical Instruments GmbH, 47533 Kleve, Germany (petar.ivanov@ametek.com)
Olaf Schultz, Spectro Analytical Instruments Gmbh, 47533 Kleve, Germany
Dirk Wuwstkamp, Spectro Analytical Instruments Gmbh, 47533 Kleve, Germany

ICP-OES with axial plasma observation are still the instruments of choice for trace analytical work. Even today, ICP-OES still plays an important role as it offers a much higher matrix tolerance than other techniques and is therefore beneficial for certain types of samples and/or elements.

Viewing the plasma radially provides generally lower sensitivity, but matrix effects are greatly reduced. Therefore the radial observation technique is typically chosen in the case of samples with high TSD (total dissolved solids) concentrations, for the routine analysis of organic solutions or where high stability and precision is required. 

The possibility to view the plasma with two interfaces (dual view) seems to solve all disadvantages, but those techniques are a compromise since only one light path is direct.

For some demanding applications, like analysis of precious metals, high salt application, analysis of highly volatile organic components, traces in metals etc. high precision and accuracy for the main components is required. At the same time the wish for low detection limits for the trace elements in the matrix makes the task more challenging.

New technologies to solve this dilemma will be discussed and the use of state of the art analytical instruments for some of those challenging applications will be present.