Introduction to Advanced Analytical Methods for Lithium and Light Elements using EDS, WDS and SXES in Electron Microscopy

Omri Dvir, Bargal Analytical Instruments, Shoham, Israel (omri.dvir@bargal.co.il)

The analysis of lithium and other light elements in electron microscopy is particularly challenging due to their low atomic number, weak X-ray signal generation, and susceptibility to beam damage. This study explores advanced methodologies combining Energy Dispersive X-ray Spectroscopy (EDS), Wavelength Dispersive Spectroscopy (WDS), and Soft X-ray Emission Spectroscopy (SXES) to enhance the detection and characterization of light elements.

Through the use of low accelerating voltages and short working distances, we demonstrate significant improvements in spatial resolution and reduced beam-induced damage, crucial for the accurate analysis of lithium-containing materials and other light-element compounds. WDS, with its superior spectral resolution, enables precise quantification of light elements, addressing the overlaps and detection limits often encountered in EDS. SXES complements these methods by providing high-energy resolution and chemical state analysis, offering an unparalleled understanding of material properties.

Our findings underscore the synergistic potential of integrating EDS, WDS, and SXES techniques for precise light-element analysis in various fields, including energy storage materials, catalysis, and advanced composites. This integrated approach not only mitigates the limitations of traditional methods but also establishes new standards for material characterization at the nanoscale.