Ambient Multiphoton Electron Extraction Spectroscopy (MEES) for Trace-Level Analytics: Gas-Phase Detection and Solid-State Applications

Tikhon Filippov, Schulich Faculty of Chemistry, Technion-Israel Institute of Technology, Hifa, Israel (tihon@technion.ac.il)
Uriah Sharon, Schulich Faculty Of Chemistry, Technion-israel Institute Of Technology, Hifa, Israel
Lea Birkan, Schulich Faculty Of Chemistry, Technion-israel Institute Of Technology, Hifa, Israel
Valery Bulatov, Schulich Faculty Of Chemistry, Technion-israel Institute Of Technology, Hifa, Israel
Israel Schechter, Schulich Faculty Of Chemistry, Technion-israel Institute Of Technology, Hifa, Israel

Multiphoton electron extraction spectroscopy (MEES) is an analytical technique in which pulsed lasers induce multiphoton processes to liberate electrons from analytes under ambient conditions. Recording electron counts as a function of excitation wavelength yields detailed spectral fingerprints that enable reliable material identification. Building on prior demonstrations for molecular traces on solid and liquid surfaces, this presentation expands MEES to multiple application spheres relevant to real-world analysis.

First, we introduce gas-phase MEES for quantitative detection of trace components in air. The method provides high sensitivity and fine spectral resolution, supporting sub-ppm to sub-ppb quantitation of volatile species without sample pretreatment. Second, we present solid-state MEES for forensic screening, demonstrating trace-level detection of surface residues associated with substances of concern in drug-facilitated crimes.

Across these fields of use, MEES operates at room temperature and ambient pressure, delivering immediate wavelength-dependent electron-emission profiles for swift identification and quantification. In this presentation, we show the use of MEES in different spheres—gas-phase analysis for ecological and environmental monitoring, and solid-state forensic analysis—positioning MEES as a versatile platform.


Ambient Multiphoton Electron Extraction Spectroscopy (MEES) for Trace-Level Analytics: Gas-Phase Detection and Solid-State Applications Tikhon Filippov, Schulich Faculty of Chemistry, Technion-Israel Institute of Technology, Hifa, Israel (tihon@technion.ac.il) Uriah Sharon, Schulich Faculty Of Chemistry, Technion-israel Institute Of Technology, Hifa, Israel Lea Birkan, Schulich Faculty Of Chemistry, Technion-israel Institute Of Technology, Hifa, Israel Valery Bulatov, Schulich Faculty Of Chemistry, Technion-israel Institute Of Technology, Hifa, Israel Israel Schechter, Schulich Faculty Of Chemistry, Technion-israel Institute Of Technology, Hifa, Israel Multiphoton electron extraction spectroscopy (MEES) is an analytical technique in which pulsed lasers induce multiphoton processes to liberate electrons from analytes under ambient conditions. Recording electron counts as a function of excitation wavelength yields detailed spectral fingerprints that enable reliable material identification. Building on prior demonstrations for molecular traces on solid and liquid surfaces, this presentation expands MEES to multiple application spheres relevant to real-world analysis. First, we introduce gas-phase MEES for quantitative detection of trace components in air. The method provides high sensitivity and fine spectral resolution, supporting sub-ppm to sub-ppb quantitation of volatile species without sample pretreatment. Second, we present solid-state MEES for forensic screening, demonstrating trace-level detection of surface residues associated with substances of concern in drug-facilitated crimes. Across these fields of use, MEES operates at room temperature and ambient pressure, delivering immediate wavelength-dependent electron-emission profiles for swift identification and quantification. In this presentation, we show the use of MEES in different spheres—gas-phase analysis for ecological and environmental monitoring, and solid-state forensic analysis—positioning MEES as a versatile platform.

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